GEMINI – Grain Analysis
Raise the efficiency of your production
For wafer dependent process management and statistical process optimization in the manufacture of solar wafers and cells, it makes sense to analyse the grain structure of multicrystalline and mono-like wafers.
The GEMINI grain analysis system is able to extract a variety of data from the natural grain structure of wafers, e.g.:
- Number of grains and size of each grain
- Overall length of grain boundaries
- Recognition of twin grains
- Percentage of the surface area occupied by the largest grain
The system is available as a stand-alone machine for measuring wafers in a laboratory environment and also as inline tool, e.g. for quick mono-like wafer characterization.
The GEMINI grain analysis system acquires multiple images of one wafer. This is necessary to obtain reliable results for the grain structure of the wafer. With numerous illuminations of one wafer it is possible to make every single grain visible.
If you require an individual solution, Intego offers free-of-charge feasibility studies based on sample parts. The prepared study will include a system design with draft specifications and a price estimate. Do not hesitate to contact us directly.