Epitaxial and Patterned Wafer Inspection

Raise the efficiency of your production

In the production of epitaxial layers, a variety of different defects can occur due to imperfect substrate quality, process-related contamination and the coating process. For their safe and reliable detection, various sophisticated inspection methods are available. In particular, photoluminescence and DIC microscopy enable the reliable detection of the critical crystallographic defects, which in certain cases can lead to component failure if not detected in time.

Detection of exposure and implantation errors as well as the control of overlay offset and CD values are of crucial importance for the complex manufacturing of microelectronic products. Intego's inspection and measurement systems are also supported by its proprietary CAD based defect detection and wafer yield prediction software. In addition to the classical evaluation algorithms, advanced neural networks for defect detection and classification are also available.

Unpatterned epiwafer inspection

• simultaneous front and back side inspection
• fast micro and macro defect inspection
• inspection with maging techniques like laser scattering, PL and DIC for sub-micron sensitivity
• detection of pits, bumps, particles, coating defects, color variation, etching residues, haze, stacking faults, triangles, carrots, basal plane dislocations, slip lines, etc.

Patterned wafer inspection

• inspection of partially processed wafers including laser micro-processing
• CAD based 2D defect detection and metrology solutions
• detection of surface and crystallographic defects as well as exposure and implantation errors, overlay errors and die shifts including critical dimension (CD) measurements
• wafer yield prediction based on advanced defect classification algorithms

Some general performance data

Application

Technology

Handling

Software

Further options

If you require an individual solution, Intego offers free-of-charge feasibility studies based on sample parts. The prepared study will include a system design with draft specifications and a price estimate. Do not hesitate to contact us directly.

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