Lock-in Thermography


Raise efficiency of your production

Intego's knowhow even makes it possible to identify challenging defects that may be located under the surface. One system is the inspection of electronic chips by means of lock-in thermography. Excitation can be performed with special lasers, LEDs or flash lamps or also directly via an electrical connection. During excitation, a very short heat impulse (10 ms) is generated on the chip, which leads to a measurable heat flow. The IR radiation intensity signal is represented visually. In most cases, the resolution of defects of < 1 μm can be achieved.

 

Performance data

Using thermography, various inspection objectives are achieved in various applications:

  • Determination of materials
  • Surface temperature
  • Pores, cracks, shrinkage cavities, delaminations
  • Electrical and mechanical defects
  • Electrical quality of modules (charge carrier lifetime)
  • Welding points and seams
  • Bonded connections
  • Detection of gas emissions

 

Further options

If you require an individual solution, Intego offers free-of-charge feasibility studies based on sample parts. The prepared study will include a system design with draft specifications and a price estimate. Do not hesitate to contact us directly.


Your contact for the lock-in thermography


Dr. Dieter-Karg
Dr. Dieter Karg

+49 9131 61082-250

dieter.karg@intego.de